Undergraduate Honors Theses

Thesis Defended

Spring 2015

Document Type


Type of Thesis

Departmental Honors



First Advisor

Markus B. Raschke


Nano-scale imaging with chemical sensitivity is required to fully understand the formation, composition, and unique emergent properties of materials. However, many of the existing high resolution techniques are limited either by their spectroscopic bandwidth or by the classes of material compatible for study. Here we show that combining Fourier transform infrared spectroscopy with scattering-scanning near-field optical microscopy provides a non-invasive, broadband alternative to measuring these systems. We demonstrate that such an approach is capable of identifying chemical composition with a resolution better than 10 nm, and can be used to directly measure near-field phenomena. Considerations for optimization and construction of such a nano-FTIR spectrometer system are also discussed.