Article

Abstract

• Recent advances in structured illumination are enabling a wide range of applications from imaging to metrology, which can benefit from advanced beam characterization techniques. Solving uniquely for the spatial distribution of polarization in a beam typically involves the use of two or more polarization optics, such as a polarizer and a waveplate, which is prohibitive for some wavelengths outside of the visible spectrum. We demonstrate a technique that circumvents the use of a waveplate by exploiting extended Gerchberg–Saxton phase retrieval to extract the phase. The technique enables high-resolution, wavefront-sensing, full-field polarimetry capable of solving for both simple and exotic polarization states, and moreover, is extensible to shorter wavelength light.

Creator

• Esashi, Yuka
• Jenkins, Nicholas W.
• Jacobs, Matthew N
• Tanksalvala, Michael
• Brooks, Nathan J.
• Kapteyn, Henry C
• Murnane, Margaret

Date Issued

• 2022

Academic Affiliation

• Electrical, Computer and Energy Engineering (ECEE)

Journal Title

• Optics Express Journal

Journal Issue/Number

• 15

Journal Volume

• 30

Last Modified

• 2024-11-09

Resource Type

• Article

Rights Statement

• In Copyright

DOI

•  https://doi.org/10.1364/oe.461658

ISSN

• 1094-4087

Language

• English [eng]

Relationships

Items

Thumbnail	Title	Date Uploaded	Visibility	Actions
	oe-30-15-27967.pdf	2024-11-09	Public	Download